Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data, enabling them to better apply and understand interferometry and length metrology.
Table of Contents:
Chapter 1 - Practical realization of the length by interferometry - General principles and
Limitations
Chapter 2 - Large field imaging interferometry for the measurement of the length of bar
shaped material measures
Chapter 3 - Fizeau Interferometry for the sub-nm accurate realization of sphere radii
Chapter 4 - Interferometry for distance metrology in space
Chapter 5 - Interferometry in air with refractive index compensation
Chapter 6 - Frequency-comb-based spectral interferometry and homodyne many-wavelength interferometry for distance measurements
Chapter 7 - Absolute distance measurement based on dispersive/spectral domain
interferometry and dual comb interferometry
Chapter 8 - Frequency- scanning interferometry-based distance metrology
Chapter 9 - pm-level distance interferometry
About the Author :
Modern Interferometry for Length Metrology: Exploring limits and novel techniques has been written by leading experts within the field of metrology and edited by René Schӧdel who is the head of the Department of Interferometry on Material Measures at the Physikalisch-Technische Bundesanstalt (PTB). Schӧdel is highly engaged in fields of optical interferometry and length metrology, and he has contributed significant findings and practical applications to this book along with the co-authors. Contributing their expert knowledge to the work are Florian Pollinger, Arnold Nicolaus, Guido Bartl, Thilo Schuldt, Nandini Bhattacharya, Steven van den Berg, Seung-Woo Kim, Yoon-Soo Jang, Armin Reichhold, Birk Andreas and Christoph Weichert.
René Schӧdel is the head of the Department of Interferometry on Material Measures at the Physikalisch-Technische Bundesanstalt (PTB), and is highly engaged in fields of optical interferometry and length metrology. Other contributors to the work are Florian Pollinger, Arnold Nicolaus, Guido Bartl, Thilo Schuldt, Nandini Bhattacharya, Steven van den Berg, Seung-Woo Kim, Yoon-Soo Jang, Armin Reichhold, Birk Andreas and Christoph Weichert.
