Characterization of Materials, 2 Volume Set

Characterization of Materials (formerly Methods in Materials Research) provides comprehensive up-to-date coverage of materials characterization techniques including computational and theoretical methods as well as crystallography, mechanical testing, thermal analysis, optical imaging and spectroscopy, and more. Editor-in-Chief, Elton Kaufmann, Ph.D. is Associate Director of the Strategic Planning Group at the Argonne National Laboratory and has published approximately 100 technical papers in refereed journals and books. Dr. Kaufmann has assembled leading experts from academia, government, and industry to provide: * A comprehensive up-to-date collection of methods used in the characterization of materials * Articles on various methods from standard to cutting edge * Periodic online updates to keep pace with latest developments * A user-friendly format that is easy and simple to search and navigate Characterization of Materials is a collection of characterization methods that is widely applicable in the wide and diverse field of materials research irrespective of discipline or ultimate application and with which researchers, engineers, and educators must have familiarity. Methods covered include: * General Vacuum Techniques * X-Ray Powder Diffraction * High Strain Rate Testing * Deep Level Transient Spectroscopy * Cyclic Voltammetry * Extended X-Ray Absorption Fine Structure * Low Energy Electron Diffraction * Thermogravimetric Analysis * Magnetometry * Transmission Electron Microscopy * Ultraviolet Photoelectron Spectroscopy This reference work is also available as a convenient online edition. For information regarding the online edition, please visit: www.mrw.interscience.wiley.com/com

Table of Contents:
Forward Preface Contributors COMMON CONCEPTS Introduction General Vacuum Techniques Mass and Density Measurements Thermometry Symmetry in Crystallography Particle Scattering Sample Preparation for Metallography COMPUTATION AND THEORETICAL METHODS Introduction Introduction to Computation Summary of Electronic Structure Methods Prediction of Phase Diagrams Simulation of Microstructural Evolution Using the Field Method Bonding in Metals Binary and Multicomponent Diffusion Molecular-Dynamics Simulation of Surface Phenomena Simulation of Chemical Vapor Deposition Processes Magnetism in Alloys Kinematic Diffraction of X-Rays Dynamical Diffraction Computation of Diffuse Intensities in Alloys MECHANICAL TESTING Introduction Tension Testing High-Strain-Rate Testing of Materials Fracture Toughness Testing Methods Hardness Testing Tribological and Wear Testing THERMAL ANALYSIS Introduction Thermal Analysis - Definitions, Codes of Practice, and Nomenclature Thermogravimetric Analysis Differential Thermal Analysis and Differential Scanning Calorimetry Combustion Calorimetry Thermal Diffusivity by the Laser Flash Technique Simultaneous Techniques Including Analysis of Gaseous Products ELECTRICAL AND ELECTRONIC MEASUREMENT Introduction Conductivity Measurement Hall Effect in Semiconductors Deep-Level Transient Spectroscopy Carrier Lifetime: Free Carrier Absorption, Photoconductivity, and Photoluminescence Capacitance-Voltage (C-V) Characterization of Semiconductors Characterization of pn Junctions MAGNETISM AND MAGNETIC MEASUREMENT Introduction Generation and Measurement of Magnetic Fields Magnetic Moment and Magnetization Theory of Magnetic Phase Transitions Magnetometry Thermomagnetic Analysis Techniques to Measure Magnetic Domain Structures Magnetotransport in Metals and Alloys Surface Magneto-Optic Kerr Effect ELECTROCHEMICAL TECHNIQUES Introduction Cyclic Voltammetry Electrochemical Techniques for Corrosion Quantification Semiconductor Electrochemistry Scanning Electrochemical Microscopy The Quartz Crystal Microbalance in Electrochemistry OPTICAL IMAGING AND SPECTROSCOPY Introduction Optical Microscopy Reflected-Light Optical Microscopy Photoluminescence Spectroscopy Ultraviolet and Visible Absorption Spectroscopy Raman Spectroscopy of Solids Ultraviolet Photoelectron Spectroscopy Ellipsometry Impulsive Stimulated Thermal Scattering RESONANCE METHODS Introduction Nuclear Magnetic Resonance Imaging Nuclear Quadrupole Resonance Electron Paramagnetic Resonance Spectroscopy Cyclotron Resonance Mössbauer Spectrometry X-RAY TECHNIQUES Introduction X-Ray Powder Diffraction XAFS Spectroscopy X-Ray and Neutron Diffuse Scattering Measurements Resonant Scattering Techniques Magnetic X-Ray Scattering X-Ray Microprobe for Fluorescence and Diffraction Analysis X-Ray Magnetic Circular Dichroism Surface X-Ray Diffraction X-Ray Diffraction Techniques for Liquid Surfaces and Monomolecular Layers ELECTRON TECHNIQUES Introduction Scanning Electron Microscopy Transmission Electron Microscopy Scanning Transmission Electron Microscopy: Z-Contrast Imaging Scanning Tunneling Microscopy Low-Energy Electron Diffraction Energy-Dispersive Spectrometry Auger Electron Spectroscopy ION-BEAM TECHNIQUES Introduction High Energy Ion-Beam Analysis Elastic Ion Scattering for Composition Analysis Nuclear Reaction Analysis and Proton-Induced Gamma Ray Emission Particle-Induced X-Ray Emission Radiation Effects Microscopy Trace Element Accelerator Mass Spectrometry Introduction to Medium-Energy Ion Beam Analysis Medium-Energy Backscattering and Forward-Recoil Spectrometry Heavy-Ion Backscattering Spectrometry NEUTRON TECHNIQUES Introduction Neutron Powder Diffraction Single-Crystal Neutron Diffraction Phonon Studies Magnetic Neutron Scattering Appendices Index

About the Author :
Dr. Kaufmann is Associate Director of the Strategic Planning Group at the Argonne National Laboratory, Argonne, Illinois. He is concurrently a physicist with the Materials Science Division at Argonne. He has been with Argonne since 1989 and has served in several positions. Dr. Kaufmann holds a B.Sc. in Physics from the Rensselaer Polytechnic Institute, Troy, New York and a Ph.D. from California Institute of Technology, Pasadena, California, where he was also a Post-Doctoral Research Assistant. Prior to joining Argonne, Dr. Kaufmann was with Lawrence Livermore National Laboratory, Livermore, California in the Chemistry and Materials Science Department as a Division Leader of Materials, and he was also with the Bell Telephone Laboratories, Murray Hill, New Jersey as a member of the Radiation Physics Research Department. Dr. Kaufmann is a member of the Materials Research Society in which he held several positions including President (1985). He is also a member of The Minerals, Metals and Materials Society, the American Association for the Advancement of Science, as well as a Fellow of the American Physical Society. He was Program Chair/Organizer of the Joint ISTEC/MRS International Workshops on High Temperature Superconductivity 5 times, Secretary of the International Union of Materials Research Societies (2001-2002), Chair of the Commission on Publications of the International Union of Materials Research Societies (1998-present), and Executive Editor of the periodical IUMRS Facets among other activities. Dr. Kaufmann has published approximately 100 technical papers in refereed journals and books and has served as co-editor of two proceeding volumes. His Avocations are writing, editing, and fine art photography.

Review :
"...all in all, a worthwhile addition to your bookshelf..." (Journal of Materials Technology, Vol 18(3), Autumn 2003) ?...a much needed addition tot he vast literature on materials science...pharmaceutical scientists will find it a most welcome addition to their library...written by several outstanding contributors...the book is well integrated, complete, and especially balanced...Highly recommended!? (Pharmaceutical Research, Vol. 20, No. 12, December 2003) "...useful to the materials scientist as a starting point for a huge number of characterization techniques..." (Polymer News) "...an outstanding sourcebook...with numerous references...and excellent descriptions...this reference book is an excellent source for practical materials research measurement techniques." (IEEE Electrical Insulation Magazine, Vol. 19, No. 4, July-August 2003) "Overall the set contains important and concise descriptions of techniques that are otherwise very difficult to find?Highly recommended..." (Choice, September 2003)