Buy Advanced Semiconductor Memories by Ashok K. Sharma
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Home > Science, Technology & Agriculture > Electronics and communications engineering > Electronics engineering > Electronic devices and materials > Advanced Semiconductor Memories: Architectures, Designs, and Applications
Advanced Semiconductor Memories: Architectures, Designs, and Applications

Advanced Semiconductor Memories: Architectures, Designs, and Applications


     0     
5
4
3
2
1



International Edition


X
About the Book

A valuable reference for the most vital microelectronic components in the marketplace DRAMs are the technology drivers of high volume semiconductor fabrication processes for new generation products that, in addition to computer markets, are finding increased usage in automotive, aviation, military and space, telecommunications, and wireless industries. A new generation of high-density and high-performance memory architectures evolving for mass storage devices, including embedded memories and nonvolatile flash memories, are serving a diverse range of applications. Comprehensive and up to date, Advanced Semiconductor Memories: Architectures, Designs, and Applications offers professionals in the semiconductor and related industries an in-depth review of advanced semiconductor memories technology developments. It provides details on: Static Random Access Memory technologies including advanced architectures, low voltage SRAMs, fast SRAMs, SOI SRAMs, and specialty SRAMs (multiport, FIFOs, CAMs) High Performance Dynamic Random Access Memory-DDRs, synchronous DRAM/SGRAM features and architectures, EDRAM, CDRAM, Gigabit DRAM scaling issues and architectures, multilevel storage DRAMs, and SOI DRAMs Applications-specific DRAM architectures and designs - VRAMs, DDR SGRAMs, RDRAMs, SLDRAMs, 3-D RAM Advanced Nonvolatile Memory designs and technologies, including floating gate cell theory, EEPROM/flash memory cell design, and multilevel flash FRAMs and reliability issues Embedded memory designs and applications, including cache, merged processor, DRAM architectures, memory cards, and multimedia applications Future memory directions with megabytes to terabytes storage capacities using RTDs, single electron memories, etc. A continuation of the topics introduced in Semiconductor Memories: Technology, Testing, and Reliability, the author's earlier work, Advanced Semiconductor Memories: Architectures, Designs, and Applications offers a much-needed reference to the major developments and future directions of advanced semiconductor memory technology.

Table of Contents:
PREFACE xix 1 INTRODUCTION TO ADVANCED SEMICONDUCTOR MEMORIES 1 1.1. Semiconductor Memories Overview 1 1.2. Advanced Semiconductor Memory Developments 8 1.3. Future Memory Directions 16 References 18 2 STATIC RANDOM ACCESS MEMORY TECHNOLOGIES 19 2.1. Basic SRAM Architecture and Cell Structures 19 2.1.1. SRAM Performance and Timing Specifications 21 2.1.2. SRAM ReadWrite Operations 23 2.2. SRAM Selection Considerations 26 2.3. High Performance SRAMs 33 2.3.1. Synchronous SRAMs Flow-Through 41 2.3.2. Zero Bus Turnaround SRAMs 43 2.3.3. Quad Data Rate SRAM 44 2.3.4. Double Data Rate SRAM 50 2.3.5. No-Turnaround Random Access Memory 51 2.4. Advanced SRAM Architectures 55 2.5. Low-Voltage SRAMs 61 2.6. BiCMOS Technology SRAMs 75 2.7. SOI SRAMs 79 2.8. Specialty SRAMs 91 2.8.1. Multiport RAMs 92 2.8.1.1. Dual-Port RAMs 92 2.8.1.2. Quadport™ RAMs 101 2.8.2. First-In-First-Out (FIFO) Memories 103 2.8.3. Content Addressable Memories (CAMs) 111 2.8.3.1. Advanced Content Addressable Memories (Examples) 116 References 122 3 HIGH-PERFORMANCE DYNAMIC RANDOM ACCESS MEMORIES 129 3.1. DRAM Technology Evolution and Trends 129 3.2. DRAM Timing Specifications and Operations 133 3.2.1. General Timing Specifications 133 3.2.2. Memory Read Operation 135 3.2.3. Memory Write Operation 138 3.2.4. Read-Modify-Write Operation 140 3.2.5. DRAM Refresh Operation 141 3.3. Extended-Data-Out DRAMS 145 3.3.1. EDO DRAM (Example) 145 3.4. Enhanced DRAM (EDRAM) 146 3.5. Synchronous DRAMGRAM Architectures 150 3.5.1. SDR SDRAMSGRAM 150 3.5.2. DDR SDRAMSGRAM Features 151 3.5.3. Synchronous DRAM 256Mb (Example) 154 3.5.3.1. Initialization 154 3.5.3.2. Register Definition 155 3.5.3.3. Commands 157 3.5.3.4. SDRAM Operations 159 3.6. Enhanced Synchronous DRAM (ESDRAM) 163 3.7. Cache DRAM (CDRAM) 166 3.8. Virtual Channel Memory (VCM) DRAMs 172 3.9. Advaned DRAM Technology Perspectives 175 3.9.1. Memory Capacitor Cell Improvements 179 3.9.2. 64-Mb DRAMs 188 3.9.3. 256-Mb DRAMs 195 3.10. Gigabit DRAM Scaling Issues and Architectures 200 3.11. Multilevel Storage DRAMs 217 3.12. SOI DRAMs 221 References 231 4 APPLICATION-SPECIFIC DRAM ARCHITECTURES AND DESIGNS 237 4.1. Video RAMs (VRAMs) 241 4.2. Synchronous Graphic RAMs (SGRAMs) 244 4.2.1. 64-Mb DDR SGRAM 246 4.2.2. 256-Mb DDR Fast Cycle RAM 253 4.3. Rambus Technology Overview 257 4.3.1. Direct RDRAM Technologies and Architectures 264 4.3.2. Direct Rambus Memory System-Based Designs 272 4.4. Synchronous Link DRAMs (SLDRAMs) 275 4.4.1. SLDRAM Standard 277 4.4.2. SLDRAM Architectural and Functional Overview 283 4.4.3. SLDRAM (Example) 285 4.5. 3-D RAM 296 4.5.1. Pixel ALU Operations 305 4.6. Memory System Design Considerations 309 References 316 5 ADVANCED NONVOLATILE MEMORY DESIGNS AND TECHNOLOGIES 319 5.1. Nonvolatile Memory Advances 319 5.1.1. Introduction 319 5.1.2. Serial EEPROMs 323 5.1.3. Flash Memory Developments 327 5.2. Floating Gate Cell Theory and Operations 334 5.2.1. Floating Gate Cell Theory 334 5.2.2. Charge Transport Mechanisms 339 5.2.2.1. Fowler-Nordheim Tunneling 340 5.2.2.2. Polyoxide Conduction 342 5.2.2.3. Channel Hot-Electron Injection (CHEI) 343 5.2.2.4. Direct Band-to-Band Tunneling 347 5.3. Nonvolatile Memory Cell and Array Designs 350 5.3.1. UV-EPROM (or EPROM) Cells 350 5.3.1.1. T-Cell EPROM 351 5.3.1.2. X-Cell EPROM 351 5.3.1.3. Staggered Virtual Ground (SVG) Cell Array EPROM 352 5.3.1.4. Alternate Metal Virtual Ground (AMG) Cell Array EPROM 353 5.3.2. EEPROM Cells 354 5.3.3. Flash Memory Cells 354 5.3.3.1. T-Cell Flash 355 5.3.3.2. Alternate Metal Ground (AMG) Flash Cell 357 5.3.3.3. Source-Coupled Split-Gate (SCSG) Flash Cell 358 5.3.3.4. Field-Enhancing Tunneling Injector Flash Cell 359 5.3.3.5. Triple-Polysilicon Virtual Ground (TPVG) Flash Cell 362 5.3.3.6. Divided Bit-Line NOR (DINOR) Flash Cell 363 5.3.3.7. AND Flash Cell 365 5.3.3.8. High Capacitive Coupling Ratio (HiCr) Flash Cell 366 5.3.3.9. NAND Flash Cell 366 5.3.4. Flash Memory Cell Basic Operation and Processes 368 5.3.5. Flash EEPROM Technology Developments 372 5.4. Flash Memory Architectures 377 5.4.1. NOR Flash Memories 378 5.4.1.1. AMD NOR Architecture Flash Memories 381 5.4.1.2. Intel Flash Memories 387 5.4.2. NAND Flash Memories 392 5.4.2.1. AMD NAND Architecture Flash Memories 393 5.4.2.2. Samsung 32M x 8-bit NAND Architecture Flash Memory 397 5.4.2.3. Virtual DRAM 401 5.4.3. DINOR Architecture Flash Memories 403 5.4.3.1. A 16-Mb DINOR Flash Memory 405 5.4.3.2. P-Channel DINOR Flash Memory 406 5.4.3.3. BiNOR Cell Flash Memory 408 5.4.4. AND Architecture Flash Memories 410 5.4.5. Specialty Flash Memories 411 5.5. Multilevel Nonvolatile Memories 412 5.5.1. Multilevel NOR Flash Memories 418 5.5.2. Multilevel NAND Flash Memories 426 5.5.2.1. A 512-Mb NAND Flash Memory 429 5.5.3. Multilevel AND Flash Memories 429 5.6. Flash Memory Reliability Issues 430 5.6.1. General Failure Mechanisms for EPROMsEEPROMs 430 5.6.1.1. Stuck Bit 434 5.6.1.2. Data Retention Degradation 434 5.6.1.3. Read Time Degradation 434 5.6.1.4. Erase Time Degradation 434 5.6.1.5. Program Time Degradation 434 5.6.1.6. Disturbs 434 5.6.2. Flash Memory Reliability 435 5.6.2.1. Flash Overerase 436 5.6.2.2. Flash Program Disturbs 436 5.6.2.3. Flash Read Disturbs 437 5.6.2.4. Flash ProgramErase Endurance 437 5.6.2.5. Flash Data Retention Failures 439 5.6.2.6. Flash Hot Carrier Reliability Effects 441 5.6.2.7. Multilevel Flash Reliability 442 5.7. Ferroelectric Memories 443 5.7.1. Technology Overview 443 5.7.2. Ferroelectric Materials and Memory Design 451 5.7.3. Megabit FRAMs 454 5.7.4. Chain FRAM (CFRAM) 463 5.7.5. Metal Ferroelectric Semiconductor FET 465 5.7.6. FRAM Reliability Issues 467 References 469 6 EMBEDDED MEMORIES DESIGNS AND APPLICATIONS 479 6.1. Embedded Memory Developments 479 6.2. Cache Memory Designs 487 6.2.1. Cache Architecture Implementation for a DSP (Example) 495 6.3. Embedded SRAMDRAM Designs 499 6.3.1. Embedded SRAM Macros 503 6.3.1.1. A IT SRAM Macro 504 6.3.1.2. A 4T SRAM Macro 506 6.3.2. Embedded DRAM Macros 508 6.3.2.1. dRAMASICs 508 6.3.2.2. A Compiled 100-MHz DRAM Macro 509 6.3.2.3. A Dual-Port Interleaved DRAM Architecture Macro 511 6.3.2.4. A 1-GHz Synchronous DRAM Macro 513 6.4. Merged Processor DRAM Architectures 516 6.5. DRAM Processes with Embedded Logic Architectures 522 6.5.1. A Modular Embedded DRAM Core 523 6.5.2. Multimedia Accelerator with Embedded DRAM 524 6.5.3. Intelligent RAM (IRAM) 527 6.5.4. Computational RAM 530 6.6. Embedded EEPROM and Flash Memories 533 6.7. Memory Cards and MultiMedia Applications 536 6.7.1. Memory Cards 536 6.7.2. Single-Chip Flash Disk 544 References 547 7 FUTURE MEMORY DIRECTIONS: MEGABYTES TO TERABYTES 549 7.1. Future Memory Developments 549 7.2. Magnetoresistive Random Access Memories (MRAMs) 551 7.2.1. MRAM Technology Developments and Tradeoffs 551 7.2.2. MRAM Cells and Architectures 556 7.2.3. 256K1-Mb GMRAMs 566 7.2.4. Multilevel MRAMs 571 7.3. Resonant Tunneling Diode-Based Memories 572 7.3.1. Resonant Tuneling Diode Theory 572 7.3.2. Tunneling SRAM (TSRAM) Cell Designs 574 7.3.3. RTD-Based Memory System (Example) 579 7.4. Single-Electron Memories 582 7.4.1. Single-Electron Device Theory 582 7.4.2. Single-Electron Memory Characteristics and Configurations 590 7.4.3. Single-Electron Devices Fabrication Techniques 595 7.4.4. Nanocrystal Memory Devices 596 7.5. Phase-Change Nonvolatile Memories 602 7.6. Protonic Nonvolatile Memories 607 7.7. Miscellaneous Memory Technology Development (Examples) 612 7.7.1. Thyristor-Based SRAM Cell (T-RAM) 613 7.7.2. Content Addressable Read-Only Memory (CAROM) 614 7.7.3. Nanotech Memories 618 7.7.4. Solid-State Holographic Memories 618 References 623 INDEX 631

About the Author :
ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability (Wiley-IEEE Press, 1997). He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.


Best Sellers


Product Details
  • ISBN-13: 9780471208136
  • Publisher: John Wiley & Sons Inc
  • Publisher Imprint: Wiley-IEEE Press
  • Height: 236 mm
  • No of Pages: 672
  • Returnable: N
  • Sub Title: Architectures, Designs, and Applications
  • Width: 160 mm
  • ISBN-10: 0471208132
  • Publisher Date: 29 Oct 2002
  • Binding: Hardback
  • Language: English
  • Returnable: N
  • Spine Width: 43 mm
  • Weight: 1164 gr


Similar Products

Add Photo
Add Photo

Customer Reviews

REVIEWS      0     
Click Here To Be The First to Review this Product
Advanced Semiconductor Memories: Architectures, Designs, and Applications
John Wiley & Sons Inc -
Advanced Semiconductor Memories: Architectures, Designs, and Applications
Writing guidlines
We want to publish your review, so please:
  • keep your review on the product. Review's that defame author's character will be rejected.
  • Keep your review focused on the product.
  • Avoid writing about customer service. contact us instead if you have issue requiring immediate attention.
  • Refrain from mentioning competitors or the specific price you paid for the product.
  • Do not include any personally identifiable information, such as full names.

Advanced Semiconductor Memories: Architectures, Designs, and Applications

Required fields are marked with *

Review Title*
Review
    Add Photo Add up to 6 photos
    Would you recommend this product to a friend?
    Tag this Book Read more
    Does your review contain spoilers?
    What type of reader best describes you?
    I agree to the terms & conditions
    You may receive emails regarding this submission. Any emails will include the ability to opt-out of future communications.

    CUSTOMER RATINGS AND REVIEWS AND QUESTIONS AND ANSWERS TERMS OF USE

    These Terms of Use govern your conduct associated with the Customer Ratings and Reviews and/or Questions and Answers service offered by Bookswagon (the "CRR Service").


    By submitting any content to Bookswagon, you guarantee that:
    • You are the sole author and owner of the intellectual property rights in the content;
    • All "moral rights" that you may have in such content have been voluntarily waived by you;
    • All content that you post is accurate;
    • You are at least 13 years old;
    • Use of the content you supply does not violate these Terms of Use and will not cause injury to any person or entity.
    You further agree that you may not submit any content:
    • That is known by you to be false, inaccurate or misleading;
    • That infringes any third party's copyright, patent, trademark, trade secret or other proprietary rights or rights of publicity or privacy;
    • That violates any law, statute, ordinance or regulation (including, but not limited to, those governing, consumer protection, unfair competition, anti-discrimination or false advertising);
    • That is, or may reasonably be considered to be, defamatory, libelous, hateful, racially or religiously biased or offensive, unlawfully threatening or unlawfully harassing to any individual, partnership or corporation;
    • For which you were compensated or granted any consideration by any unapproved third party;
    • That includes any information that references other websites, addresses, email addresses, contact information or phone numbers;
    • That contains any computer viruses, worms or other potentially damaging computer programs or files.
    You agree to indemnify and hold Bookswagon (and its officers, directors, agents, subsidiaries, joint ventures, employees and third-party service providers, including but not limited to Bazaarvoice, Inc.), harmless from all claims, demands, and damages (actual and consequential) of every kind and nature, known and unknown including reasonable attorneys' fees, arising out of a breach of your representations and warranties set forth above, or your violation of any law or the rights of a third party.


    For any content that you submit, you grant Bookswagon a perpetual, irrevocable, royalty-free, transferable right and license to use, copy, modify, delete in its entirety, adapt, publish, translate, create derivative works from and/or sell, transfer, and/or distribute such content and/or incorporate such content into any form, medium or technology throughout the world without compensation to you. Additionally,  Bookswagon may transfer or share any personal information that you submit with its third-party service providers, including but not limited to Bazaarvoice, Inc. in accordance with  Privacy Policy


    All content that you submit may be used at Bookswagon's sole discretion. Bookswagon reserves the right to change, condense, withhold publication, remove or delete any content on Bookswagon's website that Bookswagon deems, in its sole discretion, to violate the content guidelines or any other provision of these Terms of Use.  Bookswagon does not guarantee that you will have any recourse through Bookswagon to edit or delete any content you have submitted. Ratings and written comments are generally posted within two to four business days. However, Bookswagon reserves the right to remove or to refuse to post any submission to the extent authorized by law. You acknowledge that you, not Bookswagon, are responsible for the contents of your submission. None of the content that you submit shall be subject to any obligation of confidence on the part of Bookswagon, its agents, subsidiaries, affiliates, partners or third party service providers (including but not limited to Bazaarvoice, Inc.)and their respective directors, officers and employees.

    Accept

    Fresh on the Shelf


    Inspired by your browsing history


    Your review has been submitted!

    You've already reviewed this product!