Buy Advances in X-Ray Analysis Book by Burton L. Henke
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Home > Mathematics and Science Textbooks > Chemistry > Physical chemistry > Advances in X-Ray Analysis: Volume 13 Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6-8, 1969
Advances in X-Ray Analysis: Volume 13 Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6-8, 1969

Advances in X-Ray Analysis: Volume 13 Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6-8, 1969


     0     
5
4
3
2
1



Out of Stock


Notify me when this book is in stock
X
About the Book

This conference has attempted to achieve a balance in the presentation of papers on the application of current methods to established problem areas and on the introduction of new methods and applications. It has recognized the relevance of papers on basic physics and chemistry and on the total interaction of x-r~s with matter. In order to achieve sufficient depth, a topic is chosen each year for special emphasis. This conference had as its central theme, "The Interactions and Applications of Low Energy X-R~s." Those who were invited as speakers and as contributors to this volume are among the outstanding workers in the application of low energy x-ray and the associated photo-Auger electron interactions. These include A. K. Baird and W. L. Baun on Light Element Analysis and Long Wavelength Instrumentation; J. E. Hollid~, D. W. Fischer, R. J. Liefeld and D. J. Nagel on Bonding and Valence State; H. Friedman and W. P. Reidy on X-R~ Astronomy; and R. Nordberg on Photo-Auger Electron Spectroscopy. Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy. It has been most appropriate and indeed a privilege to have Dr. Herbert Friedman as a speaker and contributor to this volume.

Table of Contents:
An Introduction to Low Energy X-Ray and Electron Analysis.- Light Element Analysis.- Detection and Spectroscopy of Long Wavelength X-Rays.- Quantitative X-Ray Fluorescence Analysis with Variable Take-Off Angle.- Evaluation of Soft and Hard Scattered X-Rays as an Internal Standard for Light Element Analysis.- An Improved X-Ray Fluorescence Method for the Analysis of Museum Objects.- On-Stream Analysis of Liquid Samples Containing Elements of High and Low Atomic Number by X-Ray Fluorescence with Air and Vacuum Spectrograph.- Simultaneous X-Ray Emission Analysis of P, Si, Ca, Fe, Al, and Mg in Phosphate Rock Using a Small Computer to Correct for Matrix Variations.- Soft X-Ray Valence State Effects in Conductors.- Chemical Bonding and Valence State-Nonmetals.- Interpretation of Valence Band X-Ray Spectra.- A Vacuum Spectrometer for Studying the Chemical Effect on Soft X-Ray Spectra.- Point Scattering Theory of X-Ray K-Absorption Fine Structure.- A Versatile Vacuum Scanning Double Crystal Spectrometer for Soft X-Ray Absorption Edge Studies.- X-Ray Astronomy.- X-Ray Instrumentation for Space Experiments.- System for Non-Dispersive Analysis of Lunar X-Rays from Apollo.- Development of a Slitless Spectrograph for X-Ray Astronomy.- X-Ray Interaction Coefficients: Effect on Interpretation of Solar X-Ray Data.- X-Ray Spectrometry Properties of Potassium Acid Phthalate Crystals.- Grating Studies at X-Ray Wavelengths.- Electron Spectroscopy for Studying Chemical Bonding.- IEE - A New Type of X-Ray Photoelectron Spectrometer.- ?-Excited Auger Spectra.- The Application of X-Ray Data to the Determination of Atomic Energy Levels.- On the Symmetry of Orientation Distribution in Crystal Aggregates.- Automated Lattice Parameter Determination on Single Crystals.- Correlation of Residual Stress Level and Fatigue Damage in B. C. C. Metals.- Application of the X-Ray Two-Exposure Stress Measuring Technique to a Carburized Steel.- X-Ray Diffraction from Vibrating Quartz Plates.- X-Ray Topographic Study of Vibrating Dislocations in Ice under an AC Electric Field.- An Approach to the Solid Solution Problem Using a Computerized Identification Technique.- A Versatile Bragg-Brentano/Seeman-Bohlin Powder Diffractometer.- Measurement of Long Range Order in ?' Phase of Nickel-Base Superalloys.- Measurement of the Molecular Size of a Sodium Humate Fraction.- A New Absolute-Scale Small-Angle X-Ray Scattering Instrument.- Mass Absorption Coefficient Measurements Using Thin Films.- X-Ray Absorption Tables for the 2-to-200 a Region.- Author Index.


Best Sellers


Product Details
  • ISBN-13: 9780306381133
  • Publisher: Springer Science+Business Media
  • Publisher Imprint: Kluwer Academic/Plenum Publishers
  • Height: 240 mm
  • Returnable: N
  • Width: 160 mm
  • ISBN-10: 0306381133
  • Publisher Date: 01 May 1970
  • Binding: Hardback
  • Language: English
  • Sub Title: Volume 13 Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6-8, 1969


Similar Products

Add Photo
Add Photo

Customer Reviews

REVIEWS      0     
Click Here To Be The First to Review this Product
Advances in X-Ray Analysis: Volume 13 Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6-8, 1969
Springer Science+Business Media -
Advances in X-Ray Analysis: Volume 13 Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6-8, 1969
Writing guidlines
We want to publish your review, so please:
  • keep your review on the product. Review's that defame author's character will be rejected.
  • Keep your review focused on the product.
  • Avoid writing about customer service. contact us instead if you have issue requiring immediate attention.
  • Refrain from mentioning competitors or the specific price you paid for the product.
  • Do not include any personally identifiable information, such as full names.

Advances in X-Ray Analysis: Volume 13 Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6-8, 1969

Required fields are marked with *

Review Title*
Review
    Add Photo Add up to 6 photos
    Would you recommend this product to a friend?
    Tag this Book Read more
    Does your review contain spoilers?
    What type of reader best describes you?
    I agree to the terms & conditions
    You may receive emails regarding this submission. Any emails will include the ability to opt-out of future communications.

    CUSTOMER RATINGS AND REVIEWS AND QUESTIONS AND ANSWERS TERMS OF USE

    These Terms of Use govern your conduct associated with the Customer Ratings and Reviews and/or Questions and Answers service offered by Bookswagon (the "CRR Service").


    By submitting any content to Bookswagon, you guarantee that:
    • You are the sole author and owner of the intellectual property rights in the content;
    • All "moral rights" that you may have in such content have been voluntarily waived by you;
    • All content that you post is accurate;
    • You are at least 13 years old;
    • Use of the content you supply does not violate these Terms of Use and will not cause injury to any person or entity.
    You further agree that you may not submit any content:
    • That is known by you to be false, inaccurate or misleading;
    • That infringes any third party's copyright, patent, trademark, trade secret or other proprietary rights or rights of publicity or privacy;
    • That violates any law, statute, ordinance or regulation (including, but not limited to, those governing, consumer protection, unfair competition, anti-discrimination or false advertising);
    • That is, or may reasonably be considered to be, defamatory, libelous, hateful, racially or religiously biased or offensive, unlawfully threatening or unlawfully harassing to any individual, partnership or corporation;
    • For which you were compensated or granted any consideration by any unapproved third party;
    • That includes any information that references other websites, addresses, email addresses, contact information or phone numbers;
    • That contains any computer viruses, worms or other potentially damaging computer programs or files.
    You agree to indemnify and hold Bookswagon (and its officers, directors, agents, subsidiaries, joint ventures, employees and third-party service providers, including but not limited to Bazaarvoice, Inc.), harmless from all claims, demands, and damages (actual and consequential) of every kind and nature, known and unknown including reasonable attorneys' fees, arising out of a breach of your representations and warranties set forth above, or your violation of any law or the rights of a third party.


    For any content that you submit, you grant Bookswagon a perpetual, irrevocable, royalty-free, transferable right and license to use, copy, modify, delete in its entirety, adapt, publish, translate, create derivative works from and/or sell, transfer, and/or distribute such content and/or incorporate such content into any form, medium or technology throughout the world without compensation to you. Additionally,  Bookswagon may transfer or share any personal information that you submit with its third-party service providers, including but not limited to Bazaarvoice, Inc. in accordance with  Privacy Policy


    All content that you submit may be used at Bookswagon's sole discretion. Bookswagon reserves the right to change, condense, withhold publication, remove or delete any content on Bookswagon's website that Bookswagon deems, in its sole discretion, to violate the content guidelines or any other provision of these Terms of Use.  Bookswagon does not guarantee that you will have any recourse through Bookswagon to edit or delete any content you have submitted. Ratings and written comments are generally posted within two to four business days. However, Bookswagon reserves the right to remove or to refuse to post any submission to the extent authorized by law. You acknowledge that you, not Bookswagon, are responsible for the contents of your submission. None of the content that you submit shall be subject to any obligation of confidence on the part of Bookswagon, its agents, subsidiaries, affiliates, partners or third party service providers (including but not limited to Bazaarvoice, Inc.)and their respective directors, officers and employees.

    Accept

    Fresh on the Shelf


    Inspired by your browsing history


    Your review has been submitted!

    You've already reviewed this product!