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Home > Mathematics and Science Textbooks > Science: general issues > Scientific equipment, experiments and techniques > Microscopy > Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces(5 Oxford Series in Optical and Imaging Sciences)
Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces(5 Oxford Series in Optical and Imaging Sciences)

Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces(5 Oxford Series in Optical and Imaging Sciences)


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About the Book

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Table of Contents:
PART ONE: LEVERS AND NOISE 1: Mechanical Properties of Levers 2: Resonance Enhancement 3: Sources of Noises PART TWO: SCANNING FORCE MICROSCOPES 4: Tunneling Detection Systems 5: Capacitance Detection Systems 6: Homodyne Detection Systems 7: Heterodyne Detection Systems 8: Laser-Diode Feedback Detection Systems 9: Polarization Detection Systems 10: Deflection Detection Systems PART THREE: SCANNING FORCE MICROSCOPY 11: Electric Force Microscopy 12: Magnetic Force Microscopy 13: Atomic Force Microscopy

Review :
From reviews of the first edition: "Quite instructive as to the capabilities and limitations of the SFM, and should ignite the enthusiasm of those unconverted to high resolution microscopy." --Journal of Colloid and Interface Science "A valuable contribution to the literature, providing a sound theoretical basis." --Journal of Solid State Chemistry "A useful introductory source. Its major strength is its concise overview of the different detection methods available and the theoretical noise floor available with each. . . . useful for its discussion of noise sources, and as a supplement to review articles already published in the field." --Andrew A. Gewirth (University of Illinois), Microscopy Research and Technique "One of the nicest features of the book is a fairly comprehensive, full title, reference list complete to early 1993. Highly recommended to any microscopist working in force microscopy, especially in light of its low cover price."--Microscope "Presents a theoretical background for scanning force microscopy (SFM) starting from first principles, with experimental and technical information incorporated into each chapter."--Materials Research Bulletin From reviews of the first edition: "Quite instructive as to the capabilities and limitations of the SFM, and should ignite the enthusiasm of those unconverted to high resolution microscopy." --Journal of Colloid and Interface Science "A valuable contribution to the literature, providing a sound theoretical basis." --Journal of Solid State Chemistry "A useful introductory source. Its major strength is its concise overview of the different detection methods available and the theoretical noise floor available with each. . . . useful for its discussion of noise sources, and as a supplement to review articles already published in the field." --Andrew A. Gewirth (University of Illinois), Microscopy Research and Technique "One of the nicest features of the book is a fairly comprehensive, full title, reference list complete to early 1993. Highly recommended to any microscopist working in force microscopy, especially in light of its low cover price."--Microscope "Presents a theoretical background for scanning force microscopy (SFM) starting from first principles, with experimental and technical information incorporated into each chapter."--Materials Research Bulletin


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Product Details
  • ISBN-13: 9780195092042
  • Publisher: Oxford University Press Inc
  • Publisher Imprint: Oxford University Press Inc
  • Edition: Revised edition
  • Language: English
  • Returnable: N
  • Spine Width: 23 mm
  • Weight: 639 gr
  • ISBN-10: 019509204X
  • Publisher Date: 20 Oct 1994
  • Binding: Hardback
  • Height: 241 mm
  • No of Pages: 288
  • Series Title: 5 Oxford Series in Optical and Imaging Sciences
  • Sub Title: With Applications to Electric, Magnetic and Atomic Forces
  • Width: 162 mm


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Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces(5 Oxford Series in Optical and Imaging Sciences)
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