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1.
Semiconductor Process Reliability in Practice
Semiconductor Process Reliability in Practice
By: Zhenghao Gan, Juin Liou, Waisum Wong
Publisher: McGraw-Hill Education - Europe
No Review Yet
AED721
Binding:
Hardback
Release:
16 Nov 2012
Language:
English
International Edition
Ships within 10-12 Days Explain..
2.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
By: Wei Li, Cher Ming Tan, Yuejin Hou, Zhenghao Gan
Publisher: Springer London Ltd
No Review Yet
AED480
Binding:
Paperback
Release:
21 Apr 2013
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
By: Wei Li, Cher Ming Tan, Yuejin Hou, Zhenghao Gan
Publisher: Springer London Ltd
No Review Yet
AED478
Binding:
Hardback
Release:
07 Mar 2011
Language:
English
International Edition
Ships within 12-14 Days Explain..
4.
Semiconductor Process Reliability in Practice
Semiconductor Process Reliability in Practice
By: Zhenghao Gan, Waisum Wong, Juin J Liou
Publisher: McGraw-Hill Education - Europe
No Review Yet
AED602
Binding:
Digital (delivered electronically)
Release:
06 Oct 2012
Language:
English
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