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1.
Unified Methods for VLSI Simulation and Test Generation
Unified Methods for VLSI Simulation and Test Generation
By: Kwang-Ting (Tim) Cheng, Vishwani D. Agrawal
Publisher: Springer
No Review Yet
AED484
Binding:
Hardback
Release:
30 Jun 1989
Language:
English
International Edition
Ships within 12-14 Days Explain..
2.
Concurrent and Comparative Discrete Event Simulation
Concurrent and Comparative Discrete Event Simulation
By: Ernst G. Ulrich, Jack H. Arabian, Vishwani D. Agrawal
Publisher: Springer
No Review Yet
AED486
Binding:
Hardback
Release:
31 Dec 1993
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
Concurrent and Comparative Discrete Event Simulation
Concurrent and Comparative Discrete Event Simulation
By: Ernst G. Ulrich, Jack H. Arabian, Vishwani D. Agrawal
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED481
Binding:
Paperback
Release:
27 Sep 2012
Language:
English
International Edition
Ships within 14-16 Days Explain..
4.
Concurrent and Comparative Discrete Event Simulation
Concurrent and Comparative Discrete Event Simulation
By: Vishwani D Agrawal, Ernst G Ulrich, Jack H Arabian
Publisher: Springer My Copy UK
No Review Yet
AED105
Binding:
Paperback
Release:
31 Dec 1993
Out of Stock
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5.
Test Generation for Very Large Scale Integration Chips
Test Generation for Very Large Scale Integration Chips
By: Vishwani D. Agrawal, S.C. Seth
Publisher: IEEE Computer Society Press,U.S.
No Review Yet
AED109
Binding:
Hardback
Release:
01 Jan 1988
Language:
English
Out of Stock
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6.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal Vlsi Circuits
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal Vlsi Circuits
By: Vishwani D. Agrawal (Visiting Professor with Rutgers University, Newark, NJ, USA), Michael L. Bushnell (Rutgers University, New Brunswick, NJ, USA)
Publisher: Kluwer Academic Publishers Group
No Review Yet
AED43
Binding:
Digital online
Release:
/12/2000
Language:
English
Out of Stock
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7.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
By: Michael L Bushnell, Vishwani D Agrawal
Publisher: Springer
No Review Yet
AED368
Binding:
Graphic Novel
Release:
01 Jan 2000
Out of Stock
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8.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
By: Manoj Sachdev, Vishwani D. Agrawal
Publisher: Kluwer Academic Publishers
No Review Yet
AED664
Binding:
Hardback
Release:
31 Dec 1997
Language:
English
Out of Stock
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