Vania Vieira EstrelaVania Estrela has a B.S. degree from Federal University of Rio de Janeiro (UFRJ) in Electrical and Computer Engineering (ECE); M.Sc. from the Instituto Tecnológico de Aeronáutica (ITA), Sao Jose dos Campos; M.Sc. degree in ECE at Northwestern Universty, Evanston, Illinois (IL), USA; and Ph.D. in ECE from the Illinois Institute of Technology (IIT), Chicago, IL, USA. Taught at DeVry University; DePaul University; Universidade Estadual do Norte Fluminense (UENF), Campos de Goytacazes, Rio de Janeiro (RJ), Brazil; and for the Universidade Estadual da Zona Oeste (UEZO), Rio de Janeiro, RJ, Brazil. Visiting professor at the Polytechnic Institute of Rio de Janeiro (IPRJ)/State University of Rio de Janeiro (UERJ) in Nova Friburgo, RJ. Currently working at Universidade Federal Fluminense (UFF), Niterói, RJ for the Department of Telecommunications. Research interests include signal/image/video processing, inverse problems, computational and mathematical modeling, stochastic models, multimedia, communications, motion estimation, machine learning and geoprocessing. Reviewer for the following journals/magazines: IMAVIS (Elsevier); Pattern Recognition (Elsevier); Computers & Electrical Engineering (Elsevier); IET Image Processing; IET Computer Vision and International Journal of Image Processing (IJIP). Engaged in topics such as technology transfer, engineering/math/computer education, environmental issues and digital inclusion. Member of IEEE, and ACM. Editor of IJIP. Read More Read Less